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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

Atomic resolution Z-contrast imaging of semiconductors

Xin1, James, Browning

  • 1Department of Physics, University of Illinois at Chicago, 60607, USA. xin@magnet.fsu.edu

Journal of Electron Microscopy
|December 7, 2000
PubMed

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