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Giant Barkas effect observed for light ions channeling in Si
G M Azevedo1, P L Grande, M Behar
1Instituto de Física da Universidade Federal do Rio Grande do Sul, Avenida Bento Gonçalves 9500, 91501-970, Porto Alegre, RS, Brazil.
Physical Review Letters
|April 6, 2001
Summary
Measurements show the Barkas effect, an energy loss enhancement, is significant for helium and lithium ions in silicon. This effect, proportional to projectile charge, reaches 50% for lithium ions, aligning with theoretical models.
Area of Science:
- Physics
- Materials Science
- Nuclear Instruments and Methods
Background:
- Electronic energy loss is crucial for understanding ion-matter interactions.
- The Barkas effect describes an enhancement in energy loss related to projectile charge.
- Previous studies have explored energy loss but detailed Barkas effect analysis in silicon channeling is ongoing.
Purpose of the Study:
- To measure and analyze the electronic energy loss of helium and lithium ions in silicon.
- To isolate and quantify the Barkas effect during ion channeling.
- To compare experimental Barkas effect contributions with theoretical predictions, specifically the Lindhard model.
Main Methods:
- Channeling of (4)He and (7)Li ions along main axial directions in silicon.
- Measurements conducted at intermediate to high projectile energies.
- Separation of the Barkas effect from other energy loss contributions.
Main Results:
- Clear observation and separation of the Barkas effect for (4)He and (7)Li ions in silicon.
- The Barkas effect was found to enhance energy loss significantly, reaching approximately 50% for (7)Li ions along the Si [110] direction.
- Experimental Barkas contribution from the valence-electron gas showed good agreement with the Lindhard model.
Conclusions:
- The Barkas effect is a dominant factor in electronic energy loss for channeling ions under specific conditions.
- Experimental data validates the predictions of the Lindhard model regarding the Barkas effect in silicon.
- This study provides valuable data for ion channeling and energy loss phenomena in semiconductor materials.

