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Related Experiment Videos

Frustrated total reflection: the double-prism revisited.

A Haibel1, G Nimtz, A A Stahlhofen

  • 1II. Physikalisches Institut, Universität zu Köln, Zülpicher Strasse 77, D-50937 Köln, Germany.

Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|April 20, 2001
PubMed
Summary

Frustrated total reflection allows light transmission between denser media. This study reveals unexpected Goos-Hänchen shifts in microwave frustrated total reflection, differing from prior experiments and theories.

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Area of Science:

  • Optics
  • Electromagnetism
  • Wave Phenomena

Background:

  • Geometrical optics predicts no light penetration during total internal reflection into a rarer medium.
  • Frustrated total reflection (FTR) allows light transmission when a rarer medium is sandwiched between denser media.
  • The Goos-Hänchen effect describes spatial shifts in reflected and transmitted beams, deviating from geometrical optics predictions.

Purpose of the Study:

  • To investigate the Goos-Hänchen shift in frustrated total reflection using microwaves.
  • To explore the influence of beamwidth and angle of incidence on the Goos-Hänchen shift in FTR.
  • To reconcile discrepancies in reported spatial shift measurements and theoretical predictions.

Main Methods:

  • Experimental measurements of the Goos-Hänchen shift were conducted using microwaves.

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  • The study employed a frustrated total reflection setup, likely involving a double-prism arrangement.
  • Variations in beamwidth and angle of incidence were systematically analyzed.

    • Main Results:

    • An unexpected influence of beamwidth on the Goos-Hänchen shift was observed.
    • The angle of incidence was found to significantly affect the spatial shifts.
    • Measured shifts were inconsistent with previous experimental results and theoretical models.

    Conclusions:

    • The findings challenge existing theoretical frameworks for frustrated total reflection.
    • The study highlights the importance of considering beam parameters in FTR phenomena.
    • Further research is needed to develop comprehensive theories for microwave FTR and its applications.