Related Experiment Video
Updated: Aug 8, 2026

Scanning-probe Single-electron Capacitance Spectroscopy
Published on: July 30, 2013
Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy
B L Weeks1, Z H Barber, M Raval
1Department of Chemistry, University of Cambridge, UK.
Abstract:
A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.
More Related Videos
11:42Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
Published on: July 24, 2015
11:33All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018