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Heating of TEM specimens during ion milling

B Viguier1, A Mortensen

  • 1Department of Materials, Swiss Federal Institute of Technology in Lausanne (EPFL). bviguier@ensct.fr

Ultramicroscopy
|May 2, 2001
PubMed
Summary

Ion milling of transmission electron microscopy (TEM) specimens can cause significant heating (up to 650 K), creating artefacts. This heating is critical for materials like metal matrix composites, necessitating careful milling parameter control.

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