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Measurement of thin coatings in the confocal microscope
1Australian Key Centre for Microscopy and Microanalysis, University of Sydney, NSW 2006, Australia.
Micron (Oxford, England : 1993)
|May 4, 2001
Abstract:
The use of the confocal microscope for measurement of the thickness of thin transparent coatings, such as the varnish layer on compact discs, is described. The relationship between true and apparent thickness varies in a non-linear fashion, but intensity profiles show a good correspondence with calculated profiles. This provides the basis of a nomogram for prediction of coating thickness.