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A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
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On the electrical properties of dislocations in ZnS using electric force microscopy

G F Bai1, V F Petrenko, I Baker

  • 1Thayer School of Engineering, Dartmouth College, Hanover, New Hampshire 03755, USA.

Scanning
|June 19, 2001
PubMed

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