Quantitative measurements in in situ straining experiments in transmission electron microscopy

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A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
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A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

Published on: June 2, 2017

F Pettinari1, A Couret, D Caillard

  • 1CEMES/CNRS, BP 4347, 29 rue J. Marvig, 31 055 Toulouse Cedex 4, France.

Journal of Microscopy
|July 17, 2001
PubMed

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