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Updated: Oct 5, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Atomic force microscopy observations of in situ deformed materials: application to single crystals and thin films on

C Coupeau1, J Grilhé

  • 1Laboratoire de Métallurgie Physique UMR 6630 SP2MI, Bld P. & M. Curie 86962 Futuroscope Cedex, France. Christophe.Coupeau@univ-poitiers.fr

Journal of Microscopy
|July 17, 2001
PubMed

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