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Related Experiment Videos

STEM imaging with a thin annular detector.

J M Cowley1

  • 1Department of Physics and Astronomy, Arizona State University, Tempe 85287-1504, USA. cowleyj@asu.edu

Journal of Electron Microscopy
|July 27, 2001
PubMed
Summary
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Thin annular detectors (TAD) in scanning transmission electron microscopy enable selective imaging of specimen components. This technique distinguishes crystalline and amorphous phases and aids in analyzing disordered materials.

Area of Science:

  • Materials Science
  • Microscopy
  • Crystallography

Background:

  • Scanning transmission electron microscopy (STEM) is a powerful technique for materials characterization.
  • Distinguishing between crystalline and amorphous phases is crucial for understanding material properties.
  • Current methods may have limitations in resolving fine structural details and ordering in disordered materials.

Purpose of the Study:

  • To investigate the capabilities of thin annular detectors (TAD) in STEM for selective imaging.
  • To explore the potential of TAD for differentiating crystalline and amorphous phases.
  • To assess the application of TAD for determining medium-range ordering in amorphous materials.

Main Methods:

  • Utilizing a thin annular detector (TAD) with a specific outer-to-inner radius ratio (approx. 1.1) in STEM.

Related Experiment Videos

  • Employing post-specimen lenses to control the magnification of the diffraction pattern.
  • Analyzing the relationship between TAD imaging and nanodiffraction patterns.

    • Main Results:

    • TAD allows for selective imaging, enabling the distinction of various crystalline and amorphous phases within a specimen.
    • Variable coherence imaging is achieved by adjusting diffraction pattern magnification relative to the TAD.
    • Ultra-high resolution bright-field images and differentiated images can be obtained.
    • The technique is effective for determining medium-range ordering in amorphous or disordered materials.

    Conclusions:

    • TAD is a valuable tool in STEM for phase differentiation and high-resolution imaging.
    • TAD imaging offers a method equivalent to variable coherence imaging.
    • This approach provides a new avenue for characterizing the structural order in amorphous and disordered materials.