Trace analysis of high-purity graphite by LA-ICP-MS

Area of Science:

• Analytical Chemistry
• Materials Science

Background:

• Laser-ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) is a sensitive technique for solid sample analysis.
• Accurate trace element determination is crucial for high-purity materials like graphite.

Purpose of the Study:

• To evaluate the capability of LA-ICP-MS for trace element analysis in high-purity graphite.
• To compare quantification approaches using synthetic standards and solution-based calibration.
• To determine detection limits and assess the impact of plasma conditions.

Main Methods:

• Preparation of synthetic graphite matrix standards doped with trace elements.
• Quantitative analysis using LA-ICP-MS with both synthetic standards and solution calibration.
• Determination of detection limits under dry and wet plasma conditions.

Main Results:

• Trace elements (0.5 µg g⁻¹) in synthetic graphite were quantified with 1-7% accuracy and 2-13% RSD.
• Solution-based calibration provided comparable accuracy to synthetic standards for graphite analysis.
• Detection limits were in the low ng g⁻¹ range, improved by a factor of 10 under wet plasma conditions.

Conclusions:

• LA-ICP-MS is effective for trace element determination in high-purity graphite.
• Both synthetic standards and solution calibration are viable quantification strategies.
• Wet plasma conditions significantly enhance detection limits for graphite analysis.