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X-ray speckle contrast variation across absorption edges.

C C Retsch1, I McNulty

  • 1Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, Illinois 60439, USA.

Physical Review Letters
|August 11, 2001
PubMed
Summary

X-ray speckle contrast variation was measured near absorption edges. The study found contrast depends on the sample

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • X-ray Optics

Background:

  • X-ray speckle contrast variation (XSCV) is a technique used for probing microstructure.
  • Understanding the energy dependence of XSCV is crucial for advanced applications.
  • Existing theories do not fully explain observed phenomena near absorption edges.

Purpose of the Study:

  • To theoretically describe the energy dependency of static X-ray speckle contrast variation.
  • To investigate the influence of sample-specific absorption edges on XSCV.
  • To elucidate the relationship between XSCV, refractive index, and absorption.

Main Methods:

  • Measurement of static XSCV at varying incident photon energies.
  • Focus on energies across a sample-specific absorption edge.
  • Development of a theoretical model to explain the observed energy dependency.

Main Results:

  • XSCV is primarily dependent on the imaginary part of the complex refractive index.
  • Instrumental resolution significantly affects speckle contrast.
  • Speckle contrast diminishes with increasing absorption cross-section at the absorption edge, a finding not predicted by conventional theories.

Conclusions:

  • The presented theoretical framework accurately describes the energy-dependent behavior of XSCV.
  • The imaginary part of the refractive index plays a dominant role in XSCV near absorption edges.
  • This work highlights limitations in current XSCV theories and provides a more comprehensive understanding.

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