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Measurements of photon interference X-ray absorption fine structure (piXAFS)
L Tröger1, P Kappen, Y Nishino
1Hamburger Synchrotronstrahlungslabor HASYLAB at Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany. larc.troeger@desy.de
Journal of Synchrotron Radiation
|August 22, 2001
Summary
This study reveals a fine structure in X-ray absorption spectra, termed piXAFS, arising from initial photon state interference. piXAFS provides valuable insights into both short- and long-range atomic structures.
Area of Science:
- Condensed Matter Physics
- Materials Science
- X-ray Spectroscopy
Background:
- Extended X-ray Absorption Fine Structure (EXAFS) is a powerful technique for probing local atomic environments.
- Understanding interference effects in the initial photon state can offer complementary structural information.
Purpose of the Study:
- To demonstrate and characterize the phenomenon of piXAFS (photon initial state X-ray Absorption Fine Structure).
- To investigate the sensitivity of piXAFS to geometric atomic structure.
- To compare piXAFS with EXAFS for structural analysis.
Main Methods:
- High-precision X-ray absorption experiments using platinum and tungsten samples.
- Measurements conducted at beamline X1 at HASYLAB/DESY.
- Utilized transmission and total-electron-yield detection methods.
Main Results:
- Observed piXAFS below and above absorption edges in various sample forms.
- Demonstrated piXAFS sensitivity to geometric atomic structure.
- Fourier-transformed piXAFS data revealed short-range order information comparable to EXAFS.
- Identified sharp piXAFS structures under Bragg backscattering conditions, enabling long-range order analysis.
Conclusions:
- piXAFS is a viable technique for determining both short- and long-range atomic structures.
- piXAFS shows promise as a complementary method to EXAFS.
- Further investigation is needed to understand the role of sample scattering and to disentangle piXAFS from other spectral features.