ASCANIO: a backscattering X-ray multichannel spectrometer for synchrotron applications

Area of Science:

• Physics
• Materials Science
• Analytical Chemistry

Background:

• High count rate X-ray spectrometers are crucial for accelerating synchrotron measurements, particularly X-ray fluorescence mapping (XFM).
• Monolithic multichannel silicon drift detectors (SDDs) offer a path to developing dense, high-performance detector arrays for this purpose.

Purpose of the Study:

• To develop and characterize ASCANIO, a 16-channel backscattering X-ray spectrometer utilizing monolithic SDD modules.
• To optimize solid angle and count-rate uniformity through a novel 'tilted' configuration of SDD units.

Main Methods:

• Development of a 16-channel backscattering X-ray spectrometer (ASCANIO) based on monolithic silicon drift detector (SDD) modules.
• Implementation of a 'tilted' configuration for SDD units to enhance detection uniformity.
• Laboratory testing including cryogenic cooling and vacuum conditions, followed by spectroscopic performance verification.
• Commissioning on a synchrotron beamline (P06 at PETRA III) to evaluate performance under operational conditions.

Main Results:

• The ASCANIO system achieved a resolution of 134 eV FWHM at the Mn Kα peak.
• Under synchrotron operation, the spectrometer reached a cumulative output count rate of 20 Mcps with 20% dead time.
• The tilted configuration demonstrated positive effects on performance at the beamline.

Conclusions:

• ASCANIO represents a significant advancement in X-ray spectrometer technology for high-speed synchrotron applications.
• The developed spectrometer is suitable for demanding XFM analyses, as demonstrated by its application to a biological sample.