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Linear combination of XANES for quantitative analysis of Ti-Si binary oxides
1Department of Chemical Engineering/School of Environmental Engineering, Pohang University of Science and Technology (POSTECH), Korea. jlee@postech.ac.kr
Journal of Synchrotron Radiation
|August 22, 2001
Abstract:
A new method is demonstrated for the quantification of Ti-O-Si and Ti-O-Ti bonds in Ti-Si binary oxides. It is based on the linear combination of two reference X-ray absorption near-edge structure (XANES) spectra at the Ti K edge. The proper selection of a Ti-O-Si reference material is most important for the successful application of this method. Three Ti-Si binary oxide systems have been analysed by the new method: Ti-Si mixed oxides, titania supported on silica and Ti-substituted MCM-41 (crystalline mesoporous molecular sieve material invented by Mobil) with various Ti contents.