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Updated: Jul 10, 2026

Fabrication of a Dipole-assisted Solid Phase Extraction Microchip for Trace Metal Analysis in Water Samples
09:42

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Published on: August 7, 2016

Development of multipurpose laboratory XIEES spectrometer and its application to surface XAFS analysis of Al2O3 films

J C Lee1, S A Song, Y Yuryev

  • 1TCS Center, Samsung Advanced Institute of Technology, Suwon, Korea. cheol@sait.samsung.co.kr

Journal of Synchrotron Radiation
|August 22, 2001
PubMed

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