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Applications of dynamical diffraction under locally plane wave conditions: defects in nearly perfect crystals and
V Mocella1, Y Epelboin, J P Guigay
1User Program Division, Advanced Photon Source, Argonne National Laboratory, IL 60439, USA. mocella@esrf.fr
Abstract:
In a previous paper, the concept of a locally plane wave was explained theoretically. In such a configuration, the fringe pattern recorded on the film can be considered as a phase analyser. Here the experimental analysis is presented, showing examples of interesting applications to X-ray refractometry and to the visualization of the strain field around isolated defects.