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Updated: May 10, 2026

08:53
Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
Published on: October 9, 2012
High-precision x-ray polarimetry
B Marx1, K S Schulze, I Uschmann
1Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, D-07743 Jena, Germany. berit.marx@uni-jena.de
Physical Review Letters
|July 9, 2013
Abstract:
The polarization purity of 6.457- and 12.914-keV x rays has been improved to the level of 2.4×10(-10) and 5.7×10(-10). The polarizers are channel-cut silicon crystals using six 90° reflections. Their performance and possible applications are demonstrated in the measurement of the optical activity of a sucrose solution.
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