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Intermediate Strain Rate Material Characterization with Digital Image Correlation
Published on: March 1, 2019
Effective speed-up of slowly responding measurement systems
1NASA Ames Research Center, Moffett Field, CA 94035-1000, USA.
Abstract:
In some applications, the slow response of measurement systems can present significant control problems or cause difficulties in interpreting data sequences, even though they are quite accurate in indicating the value of an unchanging measured parameter. Happily, instrument systems often have characteristics which make it possible to apply certain advanced systems control techniques which can compensate for the inherent slowness of the instrument system. In this paper, some means of dealing with this pmblem in some scenarios are described.
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