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Updated: Oct 2, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
06:53

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Published on: July 27, 2018

Consequences of positive ions upon imaging in low vacuum scanning electron microscopy

J P Craven1, F S Baker, B L Thiel

  • 1Polymers & Colloids Group, The Cavendish Laboratory, The University of Cambridge Department of Physics, Madingley Road, Cambridge, CB3 0HE, UK. jpc35@phy.cam.ac.uk

Journal of Microscopy
|February 22, 2002
PubMed

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