Potential artifacts associated with the scanning pattern of the EMI scanner
Related Experiment Video
Updated: Oct 23, 2026

Frequency Mixing Magnetic Detection Scanner for Imaging Magnetic Particles in Planar Samples
Published on: June 9, 2016
Abstract:
Physical and geometrical considerations of the EMI scanner are used to predict that regions of the head can be missed by adopting a scanner procedure based on the nominal EMI slice thickness. Using a nominal slice thickness of 1.3 cm and effective focal spot length of 12 mm, one can predict that in the central portion of the head, up to 8% of the region scanned may not be imaged. Moreover, it is shown that simultaneous monitoring of a single focal spot by two adjacent detectors, as in the EMI system, would lead to significant overlap between the two adjacent EMI slices resulting in dual imaging. Experimental examples are shown to illustrate these two artifacts in the EMI scanner.
Related Concept Videos
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Magnetic Resonance Imaging
Atomic Emission Spectroscopy: Interference
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

