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Spatially modulated illumination microscopy allows axial distance resolution in the nanometer range

Benno Albrecht1, Antonio Virgilio Failla, Andreas Schweitzer

  • 1Applied Optics and Information Processing, Kirchhoff Institute for Physics, University of Heidelberg, Germany.

Applied Optics
|March 20, 2002
PubMed
Summary

This study introduces a novel far-field laser fluorescence microscopy technique for precise nanostructure analysis. The method enables detailed topological measurements of cellular structures, advancing our understanding of biological mechanisms.

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