Burkhard Kaulich1, Thomas Wilhein, Fabrizio Enzo Di
1X-Ray Microscopy Section, ELETTRA-Sincrotrone Trieste, Basovizzo-Trieste, Italy. kaulich@elettra.trieste.it
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This study introduces X-ray differential interference contrast (DIC) microscopy, achieving submicrometer resolution. The novel technique significantly enhances contrast for low-absorbing specimens, similar to visible-light microscopy.
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