Stem corrections for ionization chambers

Ionization chambers often exhibit a stem effect, caused by interactions of radiation with air near the chamber end, or with dielectric in the chamber stem or cable. These interactions contribute to the apparent measured exposure. To determine the stem efffect for several common ionization chamber systems, exposures were measured with TLD capsules placed at the center of 60Co fields of various sizes. These exposure measurements then were repeated with various ionization chamber systems, including two Victoreen R meters (25- and 100-R chambers), a Capintec 192 dosimeter with a Farmer 0.6-cm3 probe, a PTW transit dose probe, and an EG and G IC-18 probe with a Keithley 610-B electrometer. From a comparison of TLD and ionization chamber measurements of the variation in exposure rate with field size, stem corrections for the different systems were determined within 1%.