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Elemental analysis with a full-field X-ray fluorescence microscope and a CCD photon-counting system
Takuji Ohigashi1, Norio Watanabe, Hiroki Yokosuka
1Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennoudai, Tsukuba, Ibaraki 305-8573, Japan.
Journal of Synchrotron Radiation
|April 25, 2002
Summary
This study presents the first X-ray fluorescence microscope using a Wolter mirror and a CCD camera. It successfully mapped elemental distributions in metallic wires and diamond inclusions with high energy resolution.
Area of Science:
- Materials Science
- Microscopy
- Spectroscopy
Background:
- X-ray fluorescence (XRF) microscopy is a powerful technique for elemental analysis.
- Wolter mirrors offer excellent focusing capabilities for X-rays.
- Charge-coupled device (CCD) cameras are widely used as detectors.
Purpose of the Study:
- To present the first results from an X-ray fluorescence microscope incorporating a Wolter mirror and a CCD camera.
- To evaluate the performance of this novel microscopy setup for elemental mapping.
Main Methods:
- Utilized an X-ray fluorescence microscope equipped with a Wolter mirror.
- Employed a CCD camera as an energy-resolved two-dimensional detector operating in photon-counting mode.
- Analyzed metallic wires (Fe, Co, Ni, Cu) and synthesized diamond inclusions.
Main Results:
- Achieved two-dimensional elemental maps of metallic wires and diamond inclusions.
- Demonstrated an energy resolution of 350 eV.
- Successfully obtained spatially resolved elemental information.
Conclusions:
- The combination of a Wolter mirror and a CCD camera in an XRF microscope is effective for elemental mapping.
- This setup provides high energy resolution for detailed elemental analysis.
- The technique is suitable for analyzing various materials, including metals and synthetic diamonds.