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Related Experiment Video

Updated: Jul 16, 2026

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

Published on: March 2, 2021

Structured illumination for surface-resolved grazing-incidence X-ray scattering.

Doğa Gürsoy¹, Xiaogang Yang², Dina Sheyfer¹

¹Advanced Photon Source, Argonne National Laboratory, USA.

Journal of Synchrotron Radiation

|July 15, 2026

Summary

This study introduces a new method combining structured illumination with grazing-incidence X-ray scattering to image local thin film structures. This technique provides high-resolution insights into material properties, advancing thin film characterization.

Keywords:

X-ray scattering coded aperture grazing angle structured illumination synchrotron imaging

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Last Updated: Jul 16, 2026

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

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Small and Wide Angle X-Ray Scattering Studies of Biological Macromolecules in Solution

Small and Wide Angle X-Ray Scattering Studies of Biological Macromolecules in Solution

Published on: January 8, 2013

Area of Science:

Materials Science
Condensed Matter Physics
Nanotechnology

Background:

Grazing-incidence (GI) scattering is crucial for thin film characterization, providing surface sensitivity.
Current GI methods often yield averaged data due to beam size limitations or sample rotation requirements.

Purpose of the Study:

To develop a novel method for high-resolution, local structural analysis of thin films.
To overcome the limitations of statistical averaging in conventional GI scattering techniques.

Main Methods:

Combining structured illumination with grazing-incidence X-ray scattering.
Utilizing a computational imaging approach for data analysis.
Demonstrating the technique on an organic semiconductor thin film.

Main Results:

The method successfully captures local structural features without sample rotation.
High-resolution imaging of domain shape, orientation, and polymorphism was achieved.
The technique expands GI scattering capabilities from statistical analysis to detailed imaging.

Conclusions:

This advanced GI scattering method enables detailed local analysis of thin film properties.
The findings are critical for designing more efficient and tailored materials.
The technique offers a significant advancement in thin film characterization and material design.