J A Small1, J R Michael, D S Bright
1National Institutes of Standards and Technology, Gaithersburg, MD 20899-8371, USA. john.small@nist.gov
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Electron backscatter diffraction (EBSD) pattern quality in nanoparticles is primarily degraded by electrons escaping the sample. Using thin-film TEM substrates significantly improves EBSD pattern quality for small particles.
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