Related Experiment Videos
Application of spline wavelet transformation to the analysis of extended energy-loss fine structure
Journal of Electron Microscopy
|May 15, 2002
Abstract:
We propose a new analysis method of the extended energy-loss fine structure (EXELFS), applying the multi-resolution analysis (MRA) in the wavelet transformation. We select the cardinal spline wavelet where the rank-4 cardinal spline function is used as a scaling function to construct the mother wavelet. In contrast with the conventional analysis method, the present method is efficient in filtering out the high-frequency noise and low-frequency components introduced by the numerical analysis process without distorting the original signal components, which promises quantitative analyses with less uncertainties.