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In-depth resolution from multifrequency Born fields scattered by a dielectric strip in the Fresnel zone
Rocco Pierri1, Angelo Liseno, Raffaele Solimene
1Seconda Università di Napoli, Dipartimento di Ingegneria dell'Informazione, Aversa, Italy. rocco.pierri@unina2.it
Abstract:
The achievable depth resolution in reconstructing the permittivity profile of a dielectric strip under the Born approximation when data are collected in the Fresnel zone is studied. We consider a rectilinear measurement aperture and an orthogonal and centered rectilinear investigation domain. The roles of the aperture extent and frequency diversity are highlighted.