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Material anisotropy revealed by phase contrast in intermittent contact atomic force microscopy
Matthew S Marcus1, Robert W Carpick, Darryl Y Sasaki
1Physics Department, University of Wisconsin-Madison, Madison, Wisconsin 53706-1390, USA.
Physical Review Letters
|June 13, 2002
Summary
Phase contrast in intermittent-contact atomic force microscopy (AFM) reveals polymer monolayer properties. This AFM technique
Area of Science:
- Polymer Science
- Materials Science
- Nanotechnology
Background:
- Measuring nanoscale in-plane properties of materials typically requires contact mode atomic force microscopy (AFM).
- Intermittent-contact AFM is generally used for topography measurements, not in-plane properties.
Purpose of the Study:
- To demonstrate that phase contrast in intermittent-contact AFM can reveal in-plane structural and mechanical properties of polymer monolayers.
- To highlight the unexpected sensitivity of oscillating-tip AFM to in-plane material characteristics.
Main Methods:
- Utilizing phase contrast in intermittent-contact atomic force microscopy (AFM).
- Leveraging the inherent lateral tip displacement during cantilever oscillation in AFM.
Main Results:
- Phase contrast in intermittent-contact AFM successfully revealed in-plane structural and mechanical properties of polymer monolayers.
- The study found that nanoscale in-plane property measurements are achievable with this technique, contrary to expectations.
Conclusions:
- Intermittent-contact AFM, through phase contrast, offers a novel approach to characterizing in-plane properties of polymer thin films.
- The lateral oscillation of the AFM tip, a common feature, universally enables sensitivity to in-plane material properties across various oscillating-tip AFM techniques.