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Attenuated partial internal reflection infrared spectroscopy.

Zhenfeng Zhang1, George E Ewing

  • 1Department of Chemistry, Indiana University, Bloomington 47405, USA.

Analytical Chemistry
|June 19, 2002
PubMed
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A novel spectroscopic technique, Attenuated Partial Internal Reflection (APR) spectroscopy, offers enhanced sensitivity for studying thin films. This method can detect monolayer-level films and measure thickness across six orders of magnitude.

Area of Science:

  • Spectroscopy
  • Materials Science
  • Thin Film Analysis

Background:

  • Established spectroscopic methods like Attenuated Total Internal Reflection (ATR) rely on light attenuation.
  • Analyzing absorbing thin films requires sensitive and precise techniques.

Purpose of the Study:

  • To introduce and validate a new spectroscopic method, Attenuated Partial Internal Reflection (APR) spectroscopy.
  • To demonstrate the enhanced sensitivity and film thickness measurement capabilities of APR compared to ATR.

Main Methods:

  • Theoretical calculations using Fresnel and Airy equations to predict APR spectra.
  • Experimental validation using water films on a NaCl prism in the infrared region.

Main Results:

Related Experiment Videos

  • APR spectroscopy was successfully introduced and demonstrated experimentally.
  • APR showed higher sensitivity than ATR, capable of distinguishing monolayer water films (310 pm).
  • Interference fringes in APR spectra allowed for film thickness determination over six orders of magnitude.

    • Conclusions:

    • APR spectroscopy is a sensitive technique for analyzing absorbing films.
    • APR offers a versatile tool for both qualitative and quantitative thin film analysis, including precise thickness measurements.