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The detection of a relative afferent pupillary defect
Carolyn Glazer-Hockstein1, Alexander J Brucker
1Scheie Eye Institute, Department of Ophthalmology, University of Pennsylvania, Philadelphia 19104, USA.
American Journal of Ophthalmology
|July 4, 2002
Abstract
Purpose:
To describe a simple technique that detects a subtle relative afferent pupillary defect.
Design:
Observational report.
Methods:
With the patient seated at a slit lamp and the slit illumination turned off, a transilluminator light is swung back and forth between the eyes. The examiner observes the direct pupil light response and the consensual light response under slit-lamp magnification.
Conclusion:
Using slit-lamp magnification, the examiner may observe small amplitudes of pupillary movement in the evaluation of a relative afferent pupillary defect.