Sampling effects influence heights measured with atomic force microscopy

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Updated: Sep 30, 2026

Quantitative Hardness Measurement by Instrumented AFM-indentation
08:21

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

J B Heymann1, C Möller, D J Müller

  • 1LSBR, NIAMS, National Institutes of Health, 50 South Drive, Bethesda, MD 20892-8025, USA.

Journal of Microscopy
|July 24, 2002
PubMed

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