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Updated: Sep 30, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

High-contrast images of semiconductor sites via one-photon optical beam-induced current imaging and confocal

Vincent R Daria1, Jelda J Miranda, Caesar Saloma

  • 1National Institute of Physics, University of the Philippines, Diliman, Quezon City.

Applied Optics
|July 27, 2002
PubMed

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