Michel Martin1, Sagrario Garcia-Martin, Mauricio Hoyos
1Laboratoire de Physique et Mécanique des Milieux Hétérgènes (UMR CNRS 7636), Ecole Supérieure de Physique et de Chimie Industrielles, Paris, France. Michel.Martin@espci.fr
Carrier density in thermal field-flow fractionation (FFF) channels is temperature-dependent. Proper void time determination requires accounting for carrier thermal expansion to avoid errors in thermal FFF analysis.
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