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Sensitivity improvement of a pump-probe set-up for thin film and microstructure metrology

Jacqueline Vollmann1, Dieter M Profunser, Jürg Dual

  • 1Center of Mechanics, ETH Zentrum, Swiss Federal Institute of Technology, Zürich. vollmann@imes.mavt.ethz.ch

Ultrasonics
|August 6, 2002
PubMed

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