Surface analysis of polymers electrically improved by plasma-source ion-implantation

Area of Science:

• Materials Science
• Surface Science
• Polymer Science

Background:

• Improving electrical properties of polymers is crucial for advanced applications.
• Plasma-source ion-implantation (PSII) is a technique used for surface modification.

Purpose of the Study:

• To investigate the effect of PSII on the electrical properties of various polymers.
• To understand the relationship between PSII parameters and surface resistivity.
• To characterize the surface changes induced by PSII.

Main Methods:

• Polymers including PI, PET, PS-BD, and MPPO were treated using inert (Ar, Xe) and reactive (O2, N2) gases via PSII at 30 keV.
• Surface resistivity was measured under varying ion energy, treatment time, RF frequency, and power.
• X-ray Photoelectron Spectroscopy (XPS), Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), and Scanning Electron Microscopy (SEM) were used for surface characterization.

Main Results:

• Surface resistivity of polymers was reduced by several orders of magnitude.
• The extent of reduction depended on ion energy, dose, and ion species.
• Characterization revealed the formation of graphite carbon or cross-linked carbon-double-bond species on Ar-PSII and Xe-PSII treated MPPO surfaces.

Conclusions:

• PSII is an effective method for significantly enhancing the electrical conductivity of polymer surfaces.
• The observed improvement in surface resistivity is attributed to the creation of specific carbon structures on the polymer surface.