Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Topographical contrast in the transmission electron microscope.

A G Cullis, D M Maher

    Ultramicroscopy
    |December 1, 1975
    PubMed
    Summary

    A new transmission electron microscope imaging method, adapted from Foucault imaging, reveals surface topography at near-atomic resolution. This technique allows for precise topographical measurements of amorphous and crystalline materials.

    Related Concept Videos

    You might also read

    Related Articles

    Articles linked to this work by shared authors, journal, and citation graph.

    Sort by
    Same author

    Coming of age: reconstruction of heterosexual HIV-1 transmission in human ex vivo organ culture systems.

    Mucosal immunology·2011
    Same author

    Molecular beam deposition of optical coatings and their characterization.

    Applied optics·2010
    Same author

    Hard-x-ray lensless imaging of extended objects.

    Physical review letters·2007
    Same author

    Transmission microscopy without lenses for objects of unlimited size.

    Ultramicroscopy·2006
    Same author

    Nature of the Stranski-Krastanow transition during epitaxy of InGaAs on GaAs.

    Physical review letters·2001
    Same author

    Inverted electron-hole alignment in InAs-GaAs self-assembled quantum dots.

    Physical review letters·2000

    Area of Science:

    • Materials Science
    • Physics
    • Microscopy

    Background:

    • Transmission electron microscopy (TEM) is a powerful tool for nanoscale imaging.
    • Conventional TEM methods have limitations in resolving surface topography with high precision.
    • The Foucault method offers potential for phase-based contrast but requires adaptation for topographical imaging.

    Purpose of the Study:

    • To adapt the Foucault method for high-resolution topographical imaging in TEM.
    • To demonstrate the capability of the adapted method for quantitative measurements.
    • To apply the technique to both amorphous and crystalline materials.

    Main Methods:

    • Detailed description of an adapted Foucault imaging technique for TEM.
    • Utilizing differential phase retardations in specimen inner potential for contrast generation.
    • Selection of electrons based on phase shifts to visualize surface or interface displacements.

    Main Results:

    • Achieved near-atomic resolution for topographical imaging.
    • Demonstrated bright and dark contrast corresponding to surface or interface displacements.
    • Successfully applied the method to amorphous and crystalline specimens.
    • Performed quantitative measurements, estimating the inner potential of crystalline MgO.

    Conclusions:

    • The adapted Foucault method provides a novel approach for high-resolution topographical imaging in TEM.
    • The technique enables precise visualization and quantitative analysis of surface and interface structures.
    • This advancement has broad applicability in materials science research for studying nanoscale features.

    Related Experiment Videos