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Infrared ellipsometric view on monolayers: towards resolving structural details
E H Korte1, U Schade, W B Peatman
1Institut für Spektrochemie und Angewandte Spektroskopie, Department Berlin, Albert-Einstein-Strasse 9, 12489 Berlin-Adlershof, Germany. korte@isas-berlin.de
Analytical and Bioanalytical Chemistry
|October 25, 2002
Summary
Reflection-based spectroscopic infrared ellipsometry now detects monolayer films. Current research focuses on structural details like anisotropy and heterogeneity using advanced infrared ellipsometry methods.
Area of Science:
- Materials Science
- Spectroscopy
- Surface Science
Background:
- Spectroscopic infrared ellipsometry (SIRE) is a technique for analyzing thin films.
- Past advancements focused on increasing sensitivity for detecting thinner layers.
- Current research aims to resolve structural details like anisotropy and heterogeneity.
Purpose of the Study:
- To outline the basis and current methodical approaches of SIRE.
- To discuss the application of synchrotron radiation in infrared ellipsometry.
- To detail the setup of an infrared beamline for advanced measurements.
Main Methods:
- Reflection-based spectroscopic infrared ellipsometry.
- Simultaneous determination of optical constants and surface layer thickness.
- Analysis of molecular orientational order for structural insights.
Main Results:
- SIRE can now achieve monolayer detection limits.
- Methodic efforts are shifting towards characterizing structural properties.
- Synchrotron radiation offers potential for enhanced infrared ellipsometry.
Conclusions:
- Infrared ellipsometry is a powerful tool for thin film characterization.
- Advanced methods enable the study of complex structural features.
- Future developments may involve synchrotron-based infrared ellipsometry.