1Institut für Physik und Physikalische Technologien, TU Clausthal, Leibnizstr 4, 38678 Clausthal-Zellerfeld, Germany. schwarzer@tu-clausthal.de
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Automated backscatter Kikuchi diffraction in scanning electron microscopy rapidly distinguishes material phases and maps their distribution. This technique facilitates detailed microstructural analysis, including phase content and crystal orientation.
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