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Updated: Sep 28, 2026

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Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
Published on: September 8, 2023
Analysis of polarization by means of polarized cathodoluminescence spectroscopy in a TEM
1Department of Physics, Graduate School of Science, Osaka University, 1-16 Machikane-yama, Toyonaka, Osaka 560-0043, Japan. ohno@tem.phys.wani.osaka-u.ac.jp
Journal of Electron Microscopy
|November 29, 2002
Abstract:
We have developed a novel method to determine the polarization of light emitted from nanometre-ordered spaces in materials by means of polarized cathodoluminescence (CL) spectroscopy with an ellipsoidal mirror in a transmission electron microscope. We have shown that simulation of CL intensities in full consideration of the effect of reflection on an ellipsoidal mirror is necessary to determine the polarization.

