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Software techniques for EELS to realize about 0.3 eV energy resolution using 300 kV FEG-TEM

K Kimoto1, Y Matsui

  • 1Advanced Materials Laboratory, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan. kimoto.koji@nims.go.jp

Journal of Microscopy
|December 4, 2002
PubMed
Summary

Software techniques for electron energy-loss spectrum measurement were developed. These methods achieve high energy resolution (0.27 eV zero-loss, 0.36 eV core-loss) with excellent reproducibility using transmission electron microscopy.

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