Related Experiment Videos
Size-selective extended X-ray absorption fine structure spectroscopy of free selenium clusters
1Department of Physics, Graduate School of Science, Kyoto University, Sakyo-ku, Japan.
Physical Review Letters
|December 18, 2002
Summary
Researchers experimentally verified a new size-selective extended x-ray absorption fine structure (EXAFS) method for clusters. This technique uses both absorption and deexcitation processes for structural information, validated with selenium clusters.
Area of Science:
- Atomic and Molecular Physics
- Materials Science
- Synchrotron Radiation Science
Background:
- Extended X-ray Absorption Fine Structure (EXAFS) is a powerful technique for determining local atomic structure.
- Previous methods for size-selective cluster analysis were limited.
- A novel EXAFS approach utilizing deexcitation processes was proposed.
Purpose of the Study:
- To experimentally validate a new size-selective EXAFS method for neutral-free clusters.
- To demonstrate the utility of combining EXAFS with photoelectron-photoion coincidence spectroscopy.
- To analyze the structure of selenium (Se) clusters.
Main Methods:
- Development of synchronous measurement of EXAFS and photoelectron-photoion coincidence.
- Utilization of a third-generation intense synchrotron X-ray source.
- Application to a selenium (Se) cluster beam.
Main Results:
- Successful acquisition of EXAFS spectra for small selenium (Se) clusters.
- Experimental data obtained provides structural information.
- Comparison of experimental EXAFS spectra with theoretical predictions.
Conclusions:
- The developed synchronous measurement technique successfully verifies the proposed size-selective EXAFS method.
- The combination of EXAFS and coincidence measurements provides detailed structural insights into clusters.
- This approach is promising for the structural characterization of various atomic and molecular clusters.