Universal behavior of the resistance noise across the metal-insulator transition in silicon inversion layers

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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
09:49

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

Published on: May 13, 2020

J Jaroszyński1, Dragana Popović, T M Klapwijk

  • 1National High Magnetic Field Laboratory, Florida State University, Tallahassee, FL 32310, USA.

Physical Review Letters
|January 7, 2003
PubMed

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