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Study on tip-substrate interactions by STM and APFIM
1Institute of Solid State Physics, Graz University of Technology, Petersgasse 16, A-8010, Graz, Austria.
Abstract:
Processes occurring at the interface of two materials coming in contact, separating or moving with respect to each other have been studied with the scanning tunnelling microscope (STM) and atom-probe (AP) field ion microscopy (APFIM). STM probe tips have been first characterised by field ion microscopy (FIM), brought into well-defined contact in the STM and afterwards inspected by time-of-flight AP. The results from mechanical contact and indentation experiments, showing material transfer and neck formation, are in reasonable good agreement with computer-based simulations on metal tip-surface interactions.
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