Jielin Li1, Laurence G Hassebrook, Chun Guan
1Department of Electrical Engineering, University of Kentucky, 453 AH, Lexington, Kentucky 40506-0046, USA.
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Temporal noise in structured light projection degrades depth measurement accuracy. This study optimizes the two-frequency phase measurement technique to minimize noise variance, enhancing depth measurement repeatability for 3D imaging applications.
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