Pei-Lin Hsiung1, Xingde Li, Christian Chudoba
1Department of Electrical Engineering and Computer Science and the Research Laboratory of Electronics, Massachusetts Institute of Technology, Building 36-345,50 Vassar Street, Cambridge, Massachusetts 01239, USA.
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A new multiple-pass cavity scanning delay line enables high-speed measurements for optical coherence tomography and other applications. This technique achieves millimeter delays with minimal mirror movement, reducing misalignment sensitivity and enhancing imaging performance.
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