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A universal computation method for two-beam dynamical X-ray diffraction
XianRong Huang1, Michael Dudley
1Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook, NY 11794-2275, USA. xiahuang@ms.cc.sunysb.edu
Acta Crystallographica. Section A, Foundations of Crystallography
|February 27, 2003
Abstract:
A general-purpose method that includes nearly all possible two-beam diffraction mechanisms is presented for calculating diffracted and specularly reflected X-ray intensities from single crystals. Based on this method, it is demonstrated that a small universal computational routine can be developed to accurately treat two-beam diffraction for any scattering geometry.