Correction for piezoelectric creep in scanning probe microscopy images using polynomial mapping

Area of Science:

• Materials Science
• Nanotechnology
• Microscopy

Background:

• Scanning probe microscopy (SPM) techniques, such as atomic force microscopy (AFM), are crucial for nanoscale imaging.
• Piezoelectric creep in SPM instruments introduces image distortions, affecting measurement accuracy.
• Existing correction methods can be complex and computationally intensive.

Purpose of the Study:

• To develop a simplified polynomial mapping method for correcting SPM image distortions caused by piezoelectric creep.
• To improve the accuracy and reliability of SPM imaging by mitigating scan distortions.
• To provide a practical approach for real-time or post-acquisition image correction.

Main Methods:

• Utilized polynomial mapping with a simplified coefficient determination strategy based on the physics of piezoelectric creep.
• Implemented the correction method using the Interactive Data Language (IDL).
• Validated the technique on atomic force microscopy (AFM) images of diblock copolymer microdomains.

Main Results:

• The simplified polynomial mapping effectively corrects image distortions caused by piezoelectric creep.
• The method significantly reduces distortion from 5% of scan width to a single pixel.
• Achieved accurate image correction using only five reference points.

Conclusions:

• The developed method offers an efficient and accurate way to correct piezoelectric creep distortions in SPM images.
• This technique enhances the reliability of quantitative measurements from SPM data.
• The simplified approach makes advanced image correction more accessible for researchers using SPM techniques.