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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Anomalous diffraction of light with geometrical path statistics of rays and a Gaussian ray approximation

M Xu1, M Lax, R R Alfano

  • 1Institute for Ultrafast Spectroscopy and Lasers, New York State Center of Advanced Technology for Ultrafast Photonic Materials and Applications, New York, New York 10031, USA. minxu@sci.ccny.cuny.edu

Optics Letters
|March 27, 2003
PubMed

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